Scanning Electron Microscope


Scanning Electron Microscope(SEM):
JEOL JSM-6360LV

  Features:

  • Accelerating Voltage from 0.5 ~ 30 kV
  • High & low vacuum modes (HV & LV)
  • High Magnification from 20x - 300,000x
  • 3.0nm resolution (HV) / 4.0nm(LV)
  • Z-motion from 5 ~ 48mm
  • Stage tilt: -10° ~ +90°
  • 360° continuous rotation
  • Max specimen size 150 mm
  • Everhart Thornley detector for SEI
  • 3 segment solid state BEI detector
  • JEOL SEM Imaging Software
  • Data storage using USB Flash drive
  • Excellent imaging for Biological sample, polymer, and material science applications

Location: #02-24

Download the instruction manual for this system here

TLL Staff who would like to receive training on this system, please sign up through the Microscopy Training Form.

External users who are interested in this system, please contact the Bioimaging Group